【氮化镓】GaN基半导体器件电离辐射损伤基可靠性综述
SANDEEP V, PRAVIN J C, KUMAR S A. Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review[J]. Microelectronics Reliability, 2024, 159: 115445. DOI: 10.1016/j.microrel.2024.115445.
2024年6月25日,印度Kalasalingam Academy of Research and Education的J. Charles Pravin等人在《Microelectronics Reliability》期刊发表了题为《Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: A comprehensive review》的文章,基于对质子、中子、γ射